Silicon Test Die
Wire Bondable
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Silicon Test Die
Wire Bondable Patterns
Example Die
Wire Bonded in Cavity Package
Package Selector
Die Model
Silicon Die with Daisy Chain
Nbr
Pads
Description
Pad Size
Size (mm)
Die
Material
Metalization
Tray Qty
Part Number
Fig.
8 pairs
Daisy Chain
60 x 160µm
1.0 x 1.0mm
Si
Al
100
TD8-1.0-DC
1
16 pairs
Daisy Chain
60 x 160µm
2.5 x 2.5mm
Si
Al
100
TD16-2.5-DC
2
24 pairs
Daisy Chain
60 x 360µm
4.0 x 4.0mm
Si
Al
64
TD24-4.0-DC
3
Specs:
Die Thickness 250µm • Al Metallization 1.0µm over 0.75µm SiO
2
• Passivation = None
Daisy Chain Patterns
(Not to Scale)
Fig. 1
Fig. 2
Fig. 3
TD8-1.0-DC
1.0 x 1.0mm
151008 (A2)
TD16-2.5-DC
2.5 x 2.5mm
152516 (B2)
TD24-4.0-DC
4.0 x 4.0mm
154024 (C3)
Silicon Die with Isolated Pads
Nbr Pads
Description
Pad Size
Size (mm)
Die
Material
Metalization
Tray Qty
Part Number
Fig.
16
Isolated Pad
60µm SQ.
1.0 x1.0mm
Si
Al
100
TD16-1.0-ISO
4
32
Isolated Pad
60µm SQ.
2.5 x 2.5mm
Si
Al
100
TD32-2.5-ISO
5
48
Isolated Pad
60µm SQ.
4.0 x 4.0mm
Si
Al
64
TD48-4.0-ISO
6
Specs:
Die Thickness 250µm • Al Metallization 1.0µm over 0.75µm SiO
2
• Passivation = None
Isolated Pad Patterns
(Not to Scale)
Fig. 4
Fig. 5
Fig. 6
TD16-1.0-ISO
1.0 x 1.0mm
151016 (A1)
TD32-2.5-ISO
2.5 x 2.5mm
152533 (B1)
TD48-4.0-ISO
4.0 x 4.0mm
154048 (C1)
Silicon Die with Differential Pairs for RF/Microwave Parasitic Test
Nbr Pads
Description
Pad Size
Size (mm)
Die
Material
Metalization
Tray Qty
Part Number
Fig.
2 Pads
With Ground
Differential
Pair
Pad 60 x 160µm
Grnd 1000µm SQ.
1.0 x1.0mm
Si
Al
100
TD2-1.0-DIF
7
2 Pads
With Ground
Differential
Pair
Pad 60 x 160µm
Grnd 2500µm SQ.
2.5 x 2.5mm
Si
Al
100
TD2-2.5-DIF
8
2 Pads
With Ground
Differential
Pair
Pad 60 x 160µm
Grnd 4000µm SQ.
4.0 x 4.0mm
Si
Al
64
TD2-4.0-DIF
9
Specs:
Die Thickness 250µm • Al Metallization 1.0µm over 0.75µm SiO
2
• Passivation = None
Differential Pair Pad Patterns
(Not to Scale)
Fig. 7
Fig. 8
Fig. 9
TD2-1.0-DIF
1.0 x 1.0mm
151002 (A3)
TD2-2.5-DIF
2.5 x 2.5mm
152502 (B3)
TD2-4.0-DIF
4.0 x 4.0mm
154002 (C2)
Silicon Die with Full Al Pattern on Top Side
Nbr Pads
Description
Pad Size
Size (mm)
Die
Material
Metalization
Tray Qty
Part Number
Fig.
1 Large Pad
Full Pattern
1000µm SQ.
1.0 x1.0mm
Si
Al
100
TD1-1.0-BUS
10
1 Large Pad
Full Pattern
2500µm SQ.
2.5 x 2.5mm
Si
Al
100
TD1-2.5-BUS
11
1 Large Pad
Full Pattern
4000µm SQ.
4.0 x 4.0mm
Si
Al
64
TD1-4.0-BUS
12
Specs:
Die Thickness 250µm • Al Metallization 1.0µm over 0.75µm SiO
2
• Passivation = None
Full Pad Patterns
(Not to Scale)
Fig. 10
Fig. 11
Fig. 12
TD1-1.0-BUS
1.0 x 1.0mm
151001 (A4)
TD1-2.5-BUS
2.5 x 2.5mm
152501 (B4)
TD1-4.0-BUS
4.0 x 4.0mm
154001 (C4)
JEDEC Moisture Sensitivity Level
MSL-1
Package Selector
Test Die Part Numbering System
TD16
-
2.5
-
DC
Test Die I/O
Die Size (mm)
Patterns
Options
1=Fully Plated
2=Differential Pair
3~99=I/O Pads
1.0=1.0x1.0mm
2.5=2.5x2.5mm
4.0=4.0x4.0mm
Other sizes available
Pattern Code
:
DC
BUS
ISO
DIF
Wire Bond Code
:
DCW
Blank=Standard 250um Thick
BG##=Special Backgrinding
E = Eutectic Solder Version
Attach standard die with die attach adhesive.
Die Daisy Chain Numbering System
25
16
0
Die Size Code
I/O
Pattern Variation
10
= 1.0x1.0mm
25
= 2.5x2.5mm
40
= 4.0x4.0mm
Other Sizes Available
00
= Fully Plated Al Top Side
08
= 8 pads
16
= 16 pads
24
= 24 pads
48
= 48 pads
99
= 100 pads
0
= Bare Die
Daisy Chain Wire Bond Patterns
(DCW - Packaged inside QFN)
1
= Standard
2~8
= Variations
9
= Bus (All Pins Connected)
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Mirror Semiconductor, Inc.
17595 Harvard Ave, Suite 509
Irvine, CA 92614, USA
Toll Free
USA/Canada (866) 404-8800
Email:
info@topline.tv
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