Wire Bondable Die
With Daisy Chain
 
 
More Test Die:  Non-Passivated Test Die    •    Quartz Die   •    Flip Chip Daisy Chain   •    Other Products   •    Home
 
 
Example Perimeter
With Daisy Chain
 
Unbumped Die (Al Pads) with Daisy Chain and Passivation Openings for Wire Bonding
Pads Pad Matrix Pitch Die Size
(mm)
Passivation
Opening
Diameter
Tray Qty Metal Backing
For Eutectic
Soldering
Mount with
Die Attach
Adhesives
Order Number
Ref Quick View
48 12x12
Perimeter
18mil
457µm
6.3mm 100~150µm 25pcs
Waffle 2"
FCN48D6.3A457M-DC FCN48D6.3A457-DC FBT250
88 22x22
Perimeter
8 mil
204µm
5.08mm 80~100µm 36
Waffle 2"
FCN88G5.08A204M-DC FCN88G5.08A204-DC PB08
112 28x28
Perimeter
6 mil
152µm
5.08mm 55~86µm 36pcs
Waffle 2"
FCN112K5.08A152M-DC FCN112K5.08A152-DC PB06
176 44x44
Perimeter
8mil
204µm
10mm 80~100µm 49pcs
Waffle 4"
FCN176G10A204M-DC FCN176G10A204-DC PB08
x4
220 44x66
Perimeter
8mil
204µm
10mm x
15mm
107µm
ø102µm
20pcs
Waffle 4"
FCN220G10x15A204M-DC FCN220G10x15A204-DC PB08
x6
 
 
 
General Specifications:
Metal Composition: Al/Cu/Si (98/1/1)
Die thickness 24 mil (600~650µm). Thin die (back grinding) available on special order.
Metal Thickness: 8.9K Å   (Pitch 152µm)    17K Å   (Pitch 204~457µm)
Passivation Thickness: 8K Å   (Pitch 152~204µm)    10K Å   (Pitch 254~457µm)
Passivation Type: Nitride
 
        
 
More Test Die:  Non-Passivated Test Die    •    Quartz Die   •    Flip Chip Daisy Chain   •    Other Products   •    Home
 



Mirror Semiconductor, Inc.
17595 Harvard Ave, Suite 509
Irvine, CA 92614, USA
Toll Free USA/Canada (866) 404-8800
Email: info@topline.tv

©2019 MirrorSemi. All Rights Reserved.

Home